Dr. Bernd Tabbert
at Advanced Photonix, an OSI Optoelectronics Co.
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 23 February 2018 Presentation + Paper
Andrew Harter, Alexander Goushcha, Bernd Tabbert
Proceedings Volume 10526, 105261L (2018) https://doi.org/10.1117/12.2294960
KEYWORDS: Photodiodes, Dielectric relaxation, Semiconductors, Silicon, Diffusion, Absorption, Electrons, Performance modeling, Pulsed laser operation

SPIE Journal Paper | 8 September 2017 Open Access
Alexander Goushcha, Bernd Tabbert
OE, Vol. 56, Issue 09, 097101, (September 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.9.097101
KEYWORDS: Photodiodes, Semiconductors, Dielectric relaxation, Silicon, Diffusion, Absorption, Electrons, Time metrology, Optical engineering, Performance modeling

Proceedings Article | 9 February 2007 Paper
Ilja Goushcha, Bernd Tabbert, Alexander Goushcha
Proceedings Volume 6471, 647111 (2007) https://doi.org/10.1117/12.698022
KEYWORDS: Photodiodes, Semiconducting wafers, Diodes, Integrating spheres, Wafer-level optics, Signal to noise ratio, Interference (communication), Silicon, PIN photodiodes, Personal digital assistants

Proceedings Article | 2 March 2006 Paper
Alexander Goushcha, Bernd Tabbert, Ilja Goushcha
Proceedings Volume 6142, 61422V (2006) https://doi.org/10.1117/12.652447
KEYWORDS: Back illuminated sensors, Resistance, PIN photodiodes, Temperature metrology, Diffusion, Photodiodes, Imaging systems, Silicon, Chemical elements, Medical imaging applications

Proceedings Article | 23 February 2006 Paper
Ilja Goushcha, Bernd Tabbert, Alexander Goushcha
Proceedings Volume 6119, 61190C (2006) https://doi.org/10.1117/12.644958
KEYWORDS: Back illuminated sensors, Photodiodes, PIN photodiodes, Resistance, Temperature metrology, Diffusion, Silicon, Imaging systems, Chemical elements, Interference (communication)

Showing 5 of 7 publications
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