An improved self-reference photonic sampling method is proposed to measure the frequency response of photodiode (PD) chips. In the proposed scheme, the uneven response of the Mode-Locked Laser Source (MLLS) is eliminated by using the half-frequency photonic sampling measurements. The microwave de-embedding under short-open-load-device termination is used to realize on-chip de-embedding of the adapter network connected to the receiver of the microwave network analyzer in terms of the transmission loss and the impedance mismatch. The proposed on-chip measurement method is free of any extra electro-optical transducer standard, and an accurate measurement can still be realized without an impedance match.
A simple and novel method is proposed for the self-calibrated measurement of high-speed photodetectors (PDs) based on photonic sampling by using a mode-locked laser (MLL). Through the photonic sampling measurements, the uneven response of the MLL can be determined. The prominent advantage of the proposed method lies that the self-reference extraction of the frequency response of the PD can be achieve without the need of any extra electrical/optical transducer standard. In the experiment, a commercial PD is measured by using a MLL with the repetition frequency of 21.936 MHz. The measurement results fit in with the conventional electro-optic frequency sweep measurement.
Electroabsorption-modulated laser (EML) is integrated by distributed feedback (DFB) laser and electro-absorption modulator (EAM). Microwave interaction in the EML has been observed to limit modulation performance especially in high frequency region. In this work, the EML is investigated as a three-port network with two electrical inputs and one optical output. Scattering matrix of the device was derived theoretically and obtained experimentally. Thus, microwave equivalent circuit model of the EML can be established and microwave interaction between the DFB laser and the EAM was successfully extracted. The results reveal that microwave interaction within an integrated EML contains both electrical isolation and optical coupling. The electrical isolation is bidirectional while the optical coupling is directional, which aggravates the performance of the EML. This result can provide a reference for further device optimization design.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.