Chia-Hao Wu
at Yuan Ze Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 February 2006 Paper
Proceedings Volume 6070, 60700O (2006) https://doi.org/10.1117/12.643029
KEYWORDS: X-ray imaging, X-rays, Inspection, Image processing, Image analysis, Tolerancing, Metals, Imaging systems, Image quality, Optical inspection

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