Christopher St. John
at Sandia National Labs
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 October 2023 Presentation + Paper
P. Finnegan, C. Arrington, C. St. John, S. Carr
Proceedings Volume 12653, 1265304 (2023) https://doi.org/10.1117/12.2677134
KEYWORDS: Niobium, Resistance, Thin films, Superconductors, Tin, Nanostructured thin films, Photoresist materials, Semiconducting wafers, Temperature metrology, Metals

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