Dr. Clément Fallet Profile

Dr. Clément Fallet

Senior Application Engineer

SPIE Involvement:

Author | Leadership Workshop Facilitator

Area of Expertise:

polarimetry , metrology , instrumentation , microscopy , singular optics

Websites:

Company Website

From the breadboard to the final product, I will bring my expertise and my innovation focused mindset to your company.
After 3 years at the LPICM (Physics of Thin Films and Interfaces Laboratory) preparing my PhD thesis on development of a very innovative polarimetric microscope, I joined a start-up company designing the next generation of superresolution systems for fluorescence microscopy.
There I developped the first prototype of Bioaxial superresolution system, the CODIM100.
I then led the development and upgrade of the product, its certification and trained the R&D and Applications teams.

I am now a Project manager at Parrot Drones in charge of new payloads.

Specialties: Optics, Photonics, Matlab Programming, Image Processing and Signal Processing

Proceedings Article | 12 July 2019 Open Access

T. Lévèque, C. Fallet, M. Mandea, R. Biancale, J. Lemoine, S. Tardivel, M. Delpech, G. Ramillien, J. Panet, S. Bourgogne, F. Pereira Dos Santos, Ph. Bouyer

Proceedings Volume 11180, 111800W (2019) https://doi.org/10.1117/12.2535951

KEYWORDS: Chemical species, Satellites, Spatial resolution, Raman spectroscopy, Space operations, Geodesy, Interferometers, Clouds, Ranging, Mirrors

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Proceedings Article | 21 May 2018 Presentation + Paper

Correction of in-flight luminosity variations in multispectral UAS images, using a luminosity sensor and camera pair for improved biomass estimation in precision agriculture

Jean-Marc Gilliot, Joël Michelin, Romain Faroux, Luis Mario Domenzain, Clément Fallet

Proceedings Volume 10664, 1066405 (2018) https://doi.org/10.1117/12.2303804

KEYWORDS: Cameras, Sensors, Reflectivity, Sun, Calibration, Near infrared, Multispectral imaging, Agriculture, UAV imaging systems, Remote sensing

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Proceedings Article | 8 May 2018 Presentation + Paper

Necessary steps for the systematic calibration of a multispectral imaging system to achieve a targetless workflow in reflectance estimation: a study of Parrot SEQUOIA for precision agriculture

L. M. Domenzain, C. Fallet

Proceedings Volume 10644, 1064416 (2018) https://doi.org/10.1117/12.2304334

KEYWORDS: Sensors, Calibration, Reflectivity, Agriculture, Imaging systems, Cameras, Multispectral imaging, CMOS sensors, Vegetation, Temperature metrology

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Proceedings Article | 1 March 2016 Paper

Accurate axial localization by conical diffraction beam shaping generating a dark-helix PSF

Clement Fallet, Astrid Lassalle, Maxime Dubois-Delumeau, Gabriel Sirat

Proceedings Volume 9714, 971414 (2016) https://doi.org/10.1117/12.2212215

KEYWORDS: Point spread functions, Beam shaping, Crystals, Microscopy, Super resolution microscopy, Super resolution, Laser crystals, Wave plates, Polarizers, Polarization

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Proceedings Article | 1 March 2016 Paper

Generating 3D depletion distribution in an achromatic single-channel monolithic system

Clement Fallet, Arvid Lindberg, Gabriel Sirat

Proceedings Volume 9714, 97140H (2016) https://doi.org/10.1117/12.2212193

KEYWORDS: Stimulated emission depletion microscopy, Diffraction, Crystals, Microscopy, Point spread functions, Beam shaping, Super resolution microscopy, Super resolution, Polarization, Optical spheres, Spatial light modulators, Beam splitters

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Proceedings Article | 9 March 2015 Paper

A new method to achieve tens of nm axial super-localization based on conical diffraction PSF shaping

Clément Fallet, Maxime Dubois, Jean-Yves Tinevez, Stephane Oddos, Julien Caron, Roger Persson, Spencer Shorte, Gabriel Sirat

Proceedings Volume 9331, 93310Q (2015) https://doi.org/10.1117/12.2077712

KEYWORDS: Point spread functions, Crystals, Polarizers, Polarization, Cameras, Error analysis, Diffraction, Laser crystals, Photon polarization, Molecules

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Proceedings Article | 28 August 2014 Paper

Conical diffraction as a versatile building block to implement new imaging modalities for superresolution in fluorescence microscopy

Clément Fallet, Julien Caron, Stephane Oddos, Jean-Yves Tinevez, Lionel Moisan, Gabriel Sirat, Philippe Braitbart, Spencer Shorte

Proceedings Volume 9169, 916905 (2014) https://doi.org/10.1117/12.2061059

KEYWORDS: Super resolution, Crystals, Microscopy, Polarization, Diffraction, Confocal microscopy, Laser crystals, Molecules, Luminescence, Cameras

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SPIE Journal Paper | 23 April 2013 Open Access

Multispectral Mueller polarimetric imaging detecting residual cancer and cancer regression after neoadjuvant treatment for colorectal carcinomas

Angelo Pierangelo, Sandeep Manhas, Abdelali Benali, Clément Fallet, Jean-Laurent Totobenazara, Maria Rosaria Antonelli, Tatiana Novikova, Brice Gayet, Antonello De Martino, Pierre Validire

JBO, Vol. 18, Issue 04, 046014, (April 2013) https://doi.org/10.1117/12.10.1117/1.JBO.18.4.046014

KEYWORDS: Cancer, Polarimetry, Oncology, Multispectral imaging, Colorectal cancer, Tumors, Statistical analysis, Tissues, Colon, Rectum

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SPIE Journal Paper | 4 June 2012 Open Access

Ex vivo photometric and polarimetric multilayer characterization of human healthy colon by multispectral Mueller imaging

Angelo Pierangelo, Sandeep Manhas, Abdelali Benali, Clément Fallet, Maria-Rosaria Antonelli, Tatiana Novikova, Brice Gayet, Pierre Validire, Antonello De Martino

JBO, Vol. 17, Issue 06, 066009, (June 2012) https://doi.org/10.1117/12.10.1117/1.JBO.17.6.066009

KEYWORDS: Colon, Polarimetry, Tissues, Multispectral imaging, Reflectivity, Backscatter, Polarization, Cancer, Statistical analysis, Colorectal cancer

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Proceedings Article | 10 September 2011 Paper

Overlay measurement by angle resolved Mueller polarimetry

Clément Fallet, Tatiana Novikova, Aline Jolibois, Bicher Haj Ibrahim, Antonello De Martino, Cyril Vannuffel

Proceedings Volume 8160, 81600J (2011) https://doi.org/10.1117/12.893805

KEYWORDS: Overlay metrology, Polarimetry, Error analysis, Semiconducting wafers, Metrology, Microelectronics, Optical imaging, Objectives, Photomasks, Process control

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SPIE Journal Paper | 1 July 2011

Overlay measurements by Mueller polarimetry in back focal plane

Clément Fallet, Tatiana Novikova, Martin Foldyna, Sandeep Manhas, Bicher Haj Ibrahim, Antonello De Martino, Cyril Vannuffel, Christophe Constancias

JM3, Vol. 10, Issue 03, 033017, (July 2011) https://doi.org/10.1117/12.10.1117/1.3626852

KEYWORDS: Overlay metrology, Polarimetry, Error analysis, Silicon, Semiconducting wafers, Metrology, Optical testing, Microscopes, Critical dimension metrology, Mueller matrices

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Proceedings Article | 20 April 2011 Paper

Overlay measurements by Mueller polarimetry in the back focal plane

Tatiana Novikova, Clément Fallet, Martin Foldyna, Sandeep Manhas, Bicher Haj Ibrahim, Antonello De Martino, Cyril Vannuffel, Christophe Constancias

Proceedings Volume 7971, 797115 (2011) https://doi.org/10.1117/12.879499

KEYWORDS: Overlay metrology, Polarimetry, Metrology, Error analysis, Microscopes, Silicon, Critical dimension metrology, Manufacturing, Semiconducting wafers, Optical testing

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Proceedings Article | 24 August 2010 Paper

Applications of Mueller polarimetry in the Fourier space for overlay characterization in microelectronics

Clement Fallet, Sandeep Manhas, Antonello de Martino, Tatiana Novikova

Proceedings Volume 7767, 77670N (2010) https://doi.org/10.1117/12.862976

KEYWORDS: Overlay metrology, Polarimetry, Microelectronics, Silica, Statistical analysis, Objectives, Diffraction gratings, Microscopes, Process control, Metrology

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