Cliff G. M. De Locht
Product Manager at Melexis NV
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 February 2008 Paper
Cliff De Locht, Sven De Knibber, Sam Maddalena
Proceedings Volume 6890, 68901C (2008) https://doi.org/10.1117/12.763023
KEYWORDS: Sensors, Optical sensors, Optics manufacturing, Safety, Cameras, Optical arrays, Error analysis, Imaging systems, Semiconducting wafers, Photodiodes

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