Damon C. Duquaine
at Johns Hopkins Applied Physics Lab
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 June 2023 Presentation
Proceedings Volume PC12548, PC1254807 (2023) https://doi.org/10.1117/12.2663848
KEYWORDS: Surveillance, Performance modeling, Systems modeling, Surveillance systems, Sensors, Pathogens, Diagnostics, Diagnostic tests

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