Dayu Zhang
at China Academy of Space Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 November 2018 Paper
Proceedings Volume 10812, 108120X (2018) https://doi.org/10.1117/12.2500280
KEYWORDS: Semiconductor lasers, Aerospace engineering, Inspection, Reliability, Manufacturing, Semiconductors, Failure analysis, Fiber Bragg gratings, Optical inspection, Temperature metrology

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