Francois Rheaume
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 31 July 2002 Paper
Francois Rheaume, Anne-Laure Jousselme, Dominic Grenier, Eloi Bosse, Pierre Valin
Proceedings Volume 4729, (2002) https://doi.org/10.1117/12.477617
KEYWORDS: Probability theory, Neural networks, Reliability, Forward looking infrared, Lutetium, Image classification, Databases, Detection and tracking algorithms, Chemical elements, Pattern recognition

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