Dr. Franklin J. Wong
at Harvard John A Paulson School of Engineering and Applied Sciences
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 March 2014 Paper
Franklin Wong, Shriram Ramanathan
Proceedings Volume 8987, 89870W (2014) https://doi.org/10.1117/12.2044055
KEYWORDS: Thin films, Silicon, Corundum, Raman spectroscopy, Oxides, Vanadium, Crystals, X-ray diffraction, Thin film growth, Perovskite

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