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Guilong Gao
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Publications (3)
Proceedings Article | 15 January 2021 Paper
GaAs material photorefractive response time measurement based on spectral probe
Qing Yang, Fei Yin, Tao Wang, Guilong Gao, Kai He, Xin Yan
Proceedings Volume 11761, 117610U (2021) https://doi.org/10.1117/12.2586950
Proceedings Article | 8 February 2019 Paper
Ultrafast time-response characteristics of AlGaAs materials
Fei Yin, Qing Yang, Tao Wang, Guilong Gao, Kai He, Xin Yan, Shaohui Li
Proceedings Volume 10843, 108430W (2019) https://doi.org/10.1117/12.2506353
KEYWORDS: X-rays, Semiconductors, Ultrafast imaging, Laser beam diagnostics, Temporal resolution, Monte Carlo methods, Cameras, Ultrafast phenomena, Refractive index, Sensors
Proceedings Article | 19 October 2016 Paper
Measurement of excited layer thickness in highly photo-excited GaAs
Lingliang Liang, Jinshou Tian, Tao Wang, Shengli Wu, Fuli Li, Guilong Gao
Proceedings Volume 10155, 101551Q (2016) https://doi.org/10.1117/12.2246652
KEYWORDS: Gallium arsenide, Refractive index
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