This paper describes a new configuration of the channeled spectropolarimeter and its application for the spectroscopic
measurement of Mueller matrix. The new configuration uses the channeled spectroscopic polarization
state generator (CSPSG) consisting of a polarizer and two high-order retarders. The channeled spectropolarimeter
using the CSPSG has features that up to four independent polarimetric parameters about a sample can be
determined simultaneously from a single channeled spectrum and that it is almost immune to the wavefront
perturbations induced by the sample.
To apply the channeled spectropolarimetry for the full measurement of Mueller matrix, the CSPSG is combined
with a rotating compensator spectropolarimeter. All elements of the spectroscopic Mueller matrix are
determined from four channeled spectra. Its feature is that it requires only one rotating component for the full
Mueller matrix measurement.
A novel configuration for the channeled spectroscopic ellipsometer (CSE) is presented. The channeled spectroscopic ellipsometry is a snapshot method for the spectrally-resolved polarization analysis. In this method, multiple-order retarders are utilized to generate a channeled spectrum carrying information about the wavelength-dependent multiple parameters of polarization of light. This method has a feature that it requires no mechanical or active components for polarization-control, such as a rotating compensator and an electro-optic modulator. In spite of these advantages, however, the previously proposed configuration of the CSE has a drawback that it is susceptible to the ray-direction variation introduced by the angular fluctuation of the ellipsometric sample. To overcome this drawback, an alternative configuration for the CSE has been developed. In this configuration, the multiple-order retarders are inserted between a light source and a sample, so that the measured results are not affected by the fluctuations due to the reflection from the sample. A compact sensing head whose size is 160mm(W)×53mm(H)×30mm(D) was realized using the new configuration, and applied for the snapshot measurement of the SiO2 films deposited on a Si substrate, with the acquisition time of 20 ms. The measured thicknesses of the SiO2 films are almost agree with the results from the rotating-compensator ellipsometer. The configuration that has the multiple-order retarders in the polarization-generating section can apply to other spectroscopic polarimeters to remove the influence of the ray-direction fluctuations due to the reflection or transmission from the sample.
A novel design of the channeled spectropolarimeter suited for stable operation is presented. An integrated polarization analyzing optics made of calcite is used together with a novel signal processing procedure to add the self-recalibration feature to the channeled spectropolarimeter. The recalibration of the system parameters and
the measurement of the state of polarization are made simultaneously using only the light under measurement. A multi-channel spectrometer is also employed to avoid the errors associated with the wavelength-axis drift. Elimination of the thermal disturbance is demonstrated experimentally.
Measurements have been made on the pressure broadening coefficients of 12CH3OH, -1,5 band. Doppler-free spectra obtained with intermodulated photoacoustic measurements in the pressure range from 7 to 130 Pa yield self-broadening parameters of the strong absorption lines that produce far infrared lasing with optical pumping. The dominant absorption lines in the frequency windows of the CO2 9R(16) and 9R(18) have been re- solved into closely- lying two components separated by 14 MHz.
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