Dr. Ian R. Wallhead
Principal Optical Scientist at Selene Development LLC
SPIE Involvement:
Author
Area of Expertise:
Optical design , Automotive optics , Extreme UV , Laser projection , Illumination systems , Laser processing
Profile Summary

Ian received his B.Sc. in Physics from the University of York (UK) in 1986 and his Ph.D from the Open University (UK) in 1995. Over the last 30 years he has worked across a wide spectrum of optical engineering projects from thermal infra-red to extreme ultra-violet and in doing so has designed and developed optical systems in fields of optical metrology, laser micromachining, microlithography, solar collection, solid state illumination, diffractive optics and projection display. More recently he has been optics for autonomous vehicles.

He is also a member of the Institute of Physics, the Optical Society of America, the European Optical Society.

He is also a member of the AENOR (Spanish Association for Standards and Certification) committee on Laser Systems and Electro Optics and of the IEEE P2020 working group on automotive image quality.

He is a Chartered Physicist and Chartered Engineer.
Publications (8)

Proceedings Article | 15 May 2014 Paper
Proceedings Volume 9138, 91380G (2014) https://doi.org/10.1117/12.2052163
KEYWORDS: Eye, Safety, Projection systems, Laser applications, Pico projectors, Lead, Laser safety, Projection devices, FDA class II medical device development, LCDs

Proceedings Article | 1 May 2014 Paper
Proceedings Volume 9135, 91351Y (2014) https://doi.org/10.1117/12.2052190
KEYWORDS: LIDAR, Safety, Gated imaging, Laser sources, Pulsed laser operation, Cameras, Imaging systems, Laser safety, Nd:YAG lasers, Optical components

Proceedings Article | 18 December 2012 Paper
Proceedings Volume 8550, 85502L (2012) https://doi.org/10.1117/12.981576
KEYWORDS: Prisms, Mirrors, Beam shaping, Microelectromechanical systems, Pico projectors, Head, Prototyping, Collimation, Distortion, Optical design

Proceedings Article | 22 March 2006 Paper
M. Booth, A. Brunton, J. Cashmore, P. Elbourn, G. Elliner, M. Gower, J. Greuters, J. Hirsch, L. Kling, N. McEntee, P. Richards, V. Truffert, I. Wallhead, M. Whitfield
Proceedings Volume 6151, 61510B (2006) https://doi.org/10.1117/12.657556
KEYWORDS: Reticles, Extreme ultraviolet, Microscopes, Photomasks, Extreme ultraviolet lithography, Vibration isolation, Imaging systems, Particles, Inspection, Image analysis

Proceedings Article | 8 November 2005 Paper
M. Booth, A. Brunton, J. Cashmore, P. Elbourn, G. Elliner, M. Gower, J. Greuters, J. Hirsch, L. Kling, N. McEntee, P. Richards, V. Truffert, I. Wallhead, M. Whitfield, R. Hudyma
Proceedings Volume 5992, 59922C (2005) https://doi.org/10.1117/12.629562
KEYWORDS: Reticles, Extreme ultraviolet, Objectives, Microscopes, Mirrors, Extreme ultraviolet lithography, EUV optics, Scintillators, Inspection, Imaging systems

Showing 5 of 8 publications
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