Irene Shi
at New Ray Mask Technology Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 November 2023 Poster + Paper
Jiaying Luo, Irene Shi, Brian Zheng, Yuming Gan, Zhuowei Zhang, Tony Ge, Eric Guo
Proceedings Volume 12751, 1275110 (2023) https://doi.org/10.1117/12.2684538
KEYWORDS: Photomasks, Binary data, Plasma, Ultraviolet radiation, Scanning electron microscopy, Critical dimension metrology, Sputter deposition, Reflection, Oxygen, Mixtures

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