Dr. Isabel Vergara
at European Commission
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 31 May 2007 Paper
I. Vergara, G. Van Caenegem, F. Ibáñez
Proceedings Volume 6591, 659102 (2007) https://doi.org/10.1117/12.740799
KEYWORDS: Microsystems, Printed circuit board testing, System integration, Manufacturing, Telecommunications, Nanotechnology, Sensors, Nanoelectronics, Electronics, Sensing systems

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