Dr. James J. Dudley Profile

Dr. James J. Dudley

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 1 May 2000 Paper

Highly reliable oxide VCSELs manufactured at HP/Agilent Technologies

Robert Herrick, Sui Lim, Hongyu Deng, Qing Deng, Jim Dudley, Mark Keever, Tchang-Hun Oh, Melissa Li, M. Tashima, Lee Hodge, Xiaolong Zhang, John Herniman, Pete Evans, Bing Liang, Chun Lei

Proceedings Volume 3946, (2000) https://doi.org/10.1117/12.384365

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Reliability, Temperature metrology, Manufacturing, Thermal modeling, Fiber optics, Electroluminescence, Fiber optics tests, Oxidation

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Proceedings Article | 29 April 1999 Paper

850-nm oxide VCSEL development at Hewlett-Packard

Hongyu Deng, James Dudley, Sui Lim, Chun Lei, Bing Liang, M. Tashima, Lee Hodge, Xuemei Zhang, John Herniman, Robert Herrick

Proceedings Volume 3627, (1999) https://doi.org/10.1117/12.347103

KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Reliability, Manufacturing, Fiber optic communications, Epitaxy, Semiconducting wafers, Eye, Control systems, Oxidation

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Proceedings Article | 29 April 1999 Paper

Reliability of vertical-cavity lasers at Hewlett-Packard

Robert Herrick, Chun Lei, Mark Keever, Sui Lim, Hongyu Deng, Jim Dudley, Jay Bhagat

Proceedings Volume 3627, (1999) https://doi.org/10.1117/12.347106

KEYWORDS: Vertical cavity surface emitting lasers, Reliability, Semiconducting wafers, Oxides, Failure analysis, Compact discs, Data communications, Semiconductor lasers, Annealing, Electroluminescence

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Proceedings Article | 4 April 1997 Paper

High-performance vertical-cavity surface-emitting lasers for product applications

Chun Lei, Lee Hodge, Jim Dudley, Mark Keever, Bing Liang, Jay Bhagat, Andrew Liao

Proceedings Volume 3003, (1997) https://doi.org/10.1117/12.271069

KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Reliability, Gallium arsenide, Fiber optics, Manufacturing, Fabry–Perot interferometers, Doping, Reflectivity, Fiber optic communications

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Proceedings Article | 16 June 1993 Paper

InGaAsP vertical-cavity lasers

James Dudley, Dubravko Babic, H. Wada, M. Shimizu, R. Mirin, John Bowers, Evelyn Hu

Proceedings Volume 1850, (1993) https://doi.org/10.1117/12.146894

KEYWORDS: Mirrors, Semiconducting wafers, Semiconductor lasers, Temperature metrology, Diffraction, Laser applications, Optical pumping, Gallium arsenide, Laser damage threshold, Optical fibers

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