Dr. Jean-Jacques Yon Profile

Dr. Jean-Jacques Yon

at MINATEC

SPIE Involvement:

Author

Publications (45)

Proceedings Article | 7 June 2024 Presentation + Paper

FDSOI transistor-based uncooled microbolometer: demonstration of a 12µm pixel sensitive to IR flux

A. Albouy, G. Dumont, M. Le Cocq, C. Vialle, R. M. Kubica, L. Carle, V. Goudon, T. Perrillat-Bottonet, J. J. Yon, P. Leduc

Proceedings Volume 13046, 130460Z (2024) https://doi.org/10.1117/12.3013449

KEYWORDS: Microbolometers, Transistors, Transducers, Thermography, Semiconducting wafers, Scanning electron microscopy, Matrices, CMOS devices, Standards development, Absorption

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Proceedings Article | 13 June 2023 Presentation + Paper

Status of 8.5μm pitch bolometer developments at Lynred

Sébastien Cortial, Christophe Pautet, Bastien Bruneau, Patrick Robert, Marc Guillaumont, Ewen Henaff, Alexandra Madalina Siladie, Karine Rousseau, Joan Magnin Oddos, Frederic Bouvard, Christine Freal, Marion Guibert, Maxime Boistard, Delphine Brellier, Laurent Carle, Geoffroy Dumont, Gaëlle Eleouet, Valérie Goudon, Mélanie Le Cocq, Patrick Leduc, Denis Pelenc, Thomas Perrillat-Bottonet, Olivier Peyssonneaux, Stéphane Pocas, Claire Vialle, Jean-Jacques Yon

Proceedings Volume 12534, 125341A (2023) https://doi.org/10.1117/12.2663455

KEYWORDS: Design and modelling, Bolometers, Readout integrated circuits, Signal to noise ratio, Resistance, Absorption, Microbolometers, Sensors

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Proceedings Article | 27 May 2022 Presentation + Paper

Recent thermoresistive material evolutions at LYNRED for improving uncooled microbolometer products thermal sensitivity

Marc Guillaumont, Stéphane Altazin, Alexi Cardoso, Sébastien Tinnes, Claire Pistre, Alain Durand, Aurélien Dariel, Fabio Rossini, Clémence Laurent, Christine Fréal, Gérard Mandran, Christian Bellon, Sébastien Cortial, Matthieu Cueff, Christophe Pautet, Nicolas Boudou, Sarah Gays, Xavier Zucchi, Denis Pelenc, Jean-Jacques Yon, Wilfried Rabaud, Valérie Goudon, Claire Vialle, Stéphane Pocas, Delphine Brellier, Rachid Hida, Tony Jullien, Zouhir Mehrez, Elisa Vermande, Antoine Schembri, Pierre Brianceau

Proceedings Volume 12107, 1210716 (2022) https://doi.org/10.1117/12.2618494

KEYWORDS: Staring arrays, Microbolometers, Amorphous silicon, Sensors, Manufacturing, Signal to noise ratio, Amorphous semiconductors

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Proceedings Article | 21 November 2017 Open Access

Advanced uncooled infrared focal plane development at CEA/LETI

Jean-Luc Tissot, Eric Mottin, Jean-Luc Martin, Jean-Jacques Yon, Michel Vilain

Proceedings Volume 10569, 1056902 (2017) https://doi.org/10.1117/12.2307954

KEYWORDS: Amorphous silicon, Sensors, Microbolometers, Bolometers, Resistance, Reliability, Signal to noise ratio, Infrared radiation, Silicon, Staring arrays

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Proceedings Article | 19 September 2016 Presentation + Paper

Low noise torsional mechanical resonator for 12µm microbolometers

L. Laurent, J. J. Yon, J. S. Moulet, P. Imperinetti, L. Duraffourg

Proceedings Volume 9974, 997407 (2016) https://doi.org/10.1117/12.2237916

KEYWORDS: Resonators, Infrared sensors, Sensors, Temperature metrology, Infrared detection, Bolometers, Microbolometers, Absorption, Aluminum, Finite element methods

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Proceedings Article | 24 June 2014 Paper

Latest improvements in microbolometer thin film packaging: paving the way for low-cost consumer applications

J. Yon, G. Dumont, V. Goudon, S. Becker, A. Arnaud, S. Cortial, C. Tisse

Proceedings Volume 9070, 90701N (2014) https://doi.org/10.1117/12.2050378

KEYWORDS: Microbolometers, Packaging, Staring arrays, Semiconducting wafers, Bolometers, Infrared sensors, Thermography, Thin films, Infrared radiation, Electroluminescence

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Proceedings Article | 24 October 2012 Paper

320 x 240 uncooled IRFPA with pixel wise thin film vacuum packaging

J-J. Yon, G. Dumont, W. Rabaud, S. Becker, L. Carle, V. Goudon, C. Vialle, A. Hamelin, A. Arnaud

Proceedings Volume 8541, 85410D (2012) https://doi.org/10.1117/12.974846

KEYWORDS: Microbolometers, Packaging, Semiconducting wafers, Infrared radiation, Infrared sensors, Sensors, Bolometers, Resistance, Thin films, Staring arrays

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Proceedings Article | 24 October 2012 Paper

Latest pixel size reduction of uncooled IR-FPA at CEA, LETI

Sebastien Becker, Pierre Imperinetti, Jean-Jacques Yon, Jean-Louis Ouvrier-Buffet, Valérie Goudon, Antoine Hamelin, Claire Vialle, Agnès Arnaud

Proceedings Volume 8541, 85410C (2012) https://doi.org/10.1117/12.974579

KEYWORDS: Microbolometers, Absorption, Staring arrays, Readout integrated circuits, Resistance, Amorphous silicon, Electro optics, Infrared detectors, Infrared radiation, Reflectivity

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Proceedings Article | 31 May 2012 Paper

Current progress on pixel level packaging for uncooled IRFPA

G. Dumont, W. Rabaud, J.-J. Yon, L. Carle, V. Goudon, C. Vialle, Sébastien Becker, Antoine Hamelin, A. Arnaud

Proceedings Volume 8353, 83531I (2012) https://doi.org/10.1117/12.919918

KEYWORDS: Bolometers, Resistance, Packaging, Microbolometers, Semiconducting wafers, Imaging devices, Infrared imaging, Infrared sensors, Measurement devices, Thermography

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SPIE Journal Paper | 1 June 2011

High-performance uncooled amorphous silicon video graphics array and extended graphics array infrared focal plane arrays with 17-μm pixel pitch

Jean-Luc Tissot, Sébastien Tinnes, Alain Durand, Cristophe Minassian, Patrick Robert, Michel Vilain, Jean-Jacques Yon

OE, Vol. 50, Issue 06, 061006, (June 2011) https://doi.org/10.1117/12.10.1117/1.3572155

KEYWORDS: Amorphous silicon, Sensors, Staring arrays, Microbolometers, Video, Visualization, Infrared radiation, Temperature metrology, Readout integrated circuits, Analog electronics

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Proceedings Article | 4 May 2010 Paper

Low-resistance a-SiGe-based microbolometer pixel for future smart IR FPA

J. Yon, J. Nieto, L. Vandroux, P. Imperinetti, E. Rolland, V. Goudon, C. Vialle, A. Arnaud

Proceedings Volume 7660, 76600U (2010) https://doi.org/10.1117/12.850862

KEYWORDS: Germanium, Signal to noise ratio, Resistance, Thin films, Amorphous silicon, Microbolometers, Silicon films, Staring arrays, Readout integrated circuits, Sensors

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Proceedings Article | 7 May 2009 Paper

High-performance uncooled amorphous silicon TEC less XGA IRFPA with 17μm pixel-pitch

C. Trouilleau, B. Fièque, S. Noblet, F. Giner, D. Pochic, A. Durand, P. Robert, S. Cortial, M. Vilain, J. Tissot, J. Yon

Proceedings Volume 7298, 72980Q (2009) https://doi.org/10.1117/12.819993

KEYWORDS: Sensors, Amorphous silicon, Readout integrated circuits, Video, Electro optics, Temperature metrology, Microbolometers, Image resolution, Silicon, Prototyping

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Proceedings Article | 15 May 2008 Paper

New readout integrated circuit using continuous time fixed pattern noise correction

Bertrand Dupont, G. Chammings, G. Rapellin, C. Mandier, M. Tchagaspanian, Benoit Dupont, A. Peizerat, J. J. Yon

Proceedings Volume 6940, 69402W (2008) https://doi.org/10.1117/12.779279

KEYWORDS: Bolometers, Scattering, Capacitors, Resistance, Sensors, Readout integrated circuits, Infrared radiation, Analog electronics, Infrared bolometers, Staring arrays

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Proceedings Article | 3 May 2008 Paper

Latest amorphous silicon microbolometer developments at LETI LIR

Jean-Jacques Yon, Eric Mottin, Jean-Luc Tissot

Proceedings Volume 6940, 69401W (2008) https://doi.org/10.1117/12.780538

KEYWORDS: Staring arrays, Microbolometers, Amorphous silicon, Sensors, Readout integrated circuits, Lithography, Manufacturing, Thermography, Infrared technology, Infrared imaging

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Proceedings Article | 3 May 2008 Paper

Uncooled amorphous silicon XGA IRFPA with 17μm pixel-pitch for high end applications

B. Fieque, P. Robert, C. Minassian, M. Vilain, J. L. Tissot, A. Crastes, O. Legras, J. J. Yon

Proceedings Volume 6940, 69401X (2008) https://doi.org/10.1117/12.779488

KEYWORDS: Sensors, Amorphous silicon, Electro optics, Microbolometers, Readout integrated circuits, Video, Image resolution, Image quality, Silicon, Black bodies

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Proceedings Article | 17 April 2008 Paper

Innovative on-chip packaging applied to uncooled IRFPA

Geoffroy Dumont, Agnès Arnaud, Pierre Impérinetti, Claire Vialle, Wilfried Rabaud, Valérie Goudon, Jean-Jacques Yon

Proceedings Volume 6940, 69401Y (2008) https://doi.org/10.1117/12.780433

KEYWORDS: Microbolometers, Packaging, Bolometers, Etching, Sensors, Absorption, Resistance, Thin films, Infrared sensors, Amorphous silicon

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Proceedings Article | 24 January 2008 Paper

New architecture for TECless operation of uncooled microbolometers developed at LETI

F. Simoens, M. Tchagaspanian, A. Arnaud, P. Imperinetti, G. Chammings, J. Yon, J. Tissot, Gérard Destefanis

Proceedings Volume 6835, 683502 (2008) https://doi.org/10.1117/12.757238

KEYWORDS: Microbolometers, Sensors, Prototyping, Fourier transforms, Infrared materials, Thermography, Imaging systems, Mirrors

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Proceedings Article | 24 January 2008 Paper

Uncooled amorphous silicon 160 x 120 IRFPA with 25 um pixel-pitch for large volume applications

M. Vilain, J. Tissot, O. Legras, J. Yon, C. Minassian, B. Fièque, J. Chiappa

Proceedings Volume 6835, 68350F (2008) https://doi.org/10.1117/12.760900

KEYWORDS: Staring arrays, Sensors, Amorphous silicon, Temperature metrology, Thermography, Bolometers, Camera shutters, Analog electronics, Nonuniformity corrections, Infrared radiation

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Proceedings Article | 8 October 2007 Paper

Compact uncooled amorphous silicon 160x120 IRFPA with 25 µm pixel-pitch for large volume applications

J. L. Tissot, O. Legras, C. Minassian, P. Robert, B. Fieque, S. Tinnes, B. Dupont, J. J. Yon, A. Arnaud

Proceedings Volume 6737, 67370Y (2007) https://doi.org/10.1117/12.738312

KEYWORDS: Staring arrays, Sensors, Amorphous silicon, Bolometers, Thermography, Analog electronics, Temperature metrology, Infrared detectors, Infrared radiation, Readout integrated circuits

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Proceedings Article | 14 May 2007 Paper

Design of ADC in 25 µm pixels pitch dedicated for IRFPA image processing at LETI

M. Tchagaspanian, P. Villard, B. Dupont, G. Chammings, J. L. Martin, C. Pistre, D. Lattard, C. Chantre, A. Arnaud, J. J. Yon, F. Simoens, J. L. Tissot

Proceedings Volume 6542, 65421W (2007) https://doi.org/10.1117/12.719148

KEYWORDS: Microbolometers, Bolometers, Readout integrated circuits, Capacitors, Molybdenum, Transistors, Sensors, Analog electronics, Image processing, Staring arrays

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Proceedings Article | 14 May 2007 Paper

New IRCMOS architecture applied to uncooled microbolometers developed at LETI

F. Simoens, M. Tchagaspanian, A. Arnaud, P. Imperinetti, G. Chammings, J. J. Yon, J. L. Tissot

Proceedings Volume 6542, 65421T (2007) https://doi.org/10.1117/12.719310

KEYWORDS: Bolometers, Staring arrays, Mirrors, Microbolometers, Sensors, Thermography, Prototyping, Temperature metrology, Readout integrated circuits, Bridges

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Proceedings Article | 14 May 2007 Paper

Uncooled amorphous silicon 160 x 120 IRFPA with 25-µm pixel-pitch for large volume applications

C. Trouilleau, B. Fieque, J. Tissot, P. Robert, A. Crastes, C. Minassian, O. Legras, B. Dupont, A. Touvignon, S. Tinnes, J. Yon, A. Arnaud

Proceedings Volume 6542, 65421V (2007) https://doi.org/10.1117/12.723599

KEYWORDS: Staring arrays, Sensors, Amorphous silicon, Analog electronics, Bolometers, Readout integrated circuits, Temperature metrology, Nonuniformity corrections, Video, Infrared detectors

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Proceedings Article | 5 October 2006 Paper

Uncooled amorphous silicon IRFPAs with 25-µm pixel-pitch

J. L. Tissot, B. Fieque, C. Trouilleau, P. Robert, A. Crastes, C. Minassian, O. Legras, J. J. Yon, A. Arnaud

Proceedings Volume 6395, 63950C (2006) https://doi.org/10.1117/12.690763

KEYWORDS: Sensors, Staring arrays, Amorphous silicon, Microbolometers, Readout integrated circuits, Analog electronics, Electro optics, Infrared detectors, Enhanced vision, Temperature metrology

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Proceedings Article | 31 May 2005 Paper

First demonstration of 25 µm pitch uncooled amorphous silicon microbolometer IRFPA at LETI-LIR

J. Yon, A. Astier, S. Bisotto, G. Chamingis, A. Durand, J. Martin, E. Mottin, J. Ouvrier-Buffet, J. Tissot

Proceedings Volume 5783, (2005) https://doi.org/10.1117/12.606487

KEYWORDS: Microbolometers, Amorphous silicon, Staring arrays, Sensors, Readout integrated circuits, Thermography, Bolometers, Temperature metrology, Electronics, Interference (communication)

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Proceedings Article | 7 March 2005 Paper

Microcavity light emitters and microbolometer detectors for gas monitoring in the 2-5 µm range

Eric Mottin, Philippe Ballet, Francois Levy, L. Mathieu, Jean Louis Ouvrier-Buffet, J. Rothman, Jean Jacques Yon, Emmanuel Hadji, Emmanuel Picard

Proceedings Volume 5739, (2005) https://doi.org/10.1117/12.588584

KEYWORDS: Sensors, Absorption, Mirrors, Optical microcavities, Carbon monoxide, Infrared radiation, Infrared sensors, Heterojunctions, Semiconductor lasers, Microbolometers

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Proceedings Article | 16 February 2005 Paper

Low-cost uncooled IRFPA and molded IR lenses for enhanced driver vision

Olivier Legras, Arnaud Crastes, Jean-Luc Tissot, Yann Guimond, Pier Claudio Antonello, Joël Leleve, Hans-Joachim Lenz, Pierre Potet, Jean Jacques Yon

Proceedings Volume 5663, (2005) https://doi.org/10.1117/12.608344

KEYWORDS: Thermography, Glasses, Infrared radiation, Infrared imaging, Infrared lenses, Enhanced vision, Lenses, Germanium, Staring arrays, Driver's vision enhancers

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Proceedings Article | 10 January 2005 Paper

Advanced packaging development for very low cost uncooled IRFPA

Astrid Astier, Agnes Arnaud, Jean-Louis Ouvrier-Buffet, Jean-Jacques Yon

Proceedings Volume 5640, (2005) https://doi.org/10.1117/12.579958

KEYWORDS: Microbolometers, Packaging, Absorption, Amorphous silicon, Sensors, Semiconducting wafers, Silicon, Manufacturing, Etching, Antireflective coatings

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Proceedings Article | 6 December 2004 Paper

IRFPA modeling: examples and applications in SWIR and LWIR

Alain Durand, Eric de Borniol, Regis Vinciguerra, Thierry Cathala, Jean Jacques Yon, Pierre Castelein, Robert Tronel, Gerard Destefanis

Proceedings Volume 5612, (2004) https://doi.org/10.1117/12.579358

KEYWORDS: Infrared imaging, Sensors, Electro optical modeling, Cameras, Short wave infrared radiation, Bolometers, Long wavelength infrared, Infrared radiation, Thermal modeling, Infrared sensors

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Proceedings Article | 6 December 2004 Paper

Uncooled IRFPA with high-performance and low-thermal time constant

Jean Luc Tissot, Michel Vilain, Arnaud Crastes, Sebastien Tinnes, Annick Larre, Olivier Legras, Jean Jacques Yon

Proceedings Volume 5612, (2004) https://doi.org/10.1117/12.578227

KEYWORDS: Sensors, Readout integrated circuits, Manufacturing, Thermography, Amorphous silicon, Infrared imaging, Infrared radiation, Staring arrays, Electro optics, Microbolometers

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Proceedings Article | 4 November 2004 Paper

Recent development in infrared technologies at LETI for Earth observation

Jean Jacques Yon, Gerard Destefanis, Eric Mottin

Proceedings Volume 5570, (2004) https://doi.org/10.1117/12.565530

KEYWORDS: Sensors, Microbolometers, Amorphous silicon, Staring arrays, Mercury cadmium telluride, Mid-IR, Absorption, Infrared sensors, Diodes, Readout integrated circuits

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Proceedings Article | 30 August 2004 Paper

Advanced packaging development for very low cost uncooled IRFPA

Astrid Astier, Agnes Arnaud, Jean-Louis Ouvrier-Buffet, Jean-Jacques Yon, Eric Mottin

Proceedings Volume 5406, (2004) https://doi.org/10.1117/12.544122

KEYWORDS: Microbolometers, Packaging, Absorption, Amorphous silicon, Sensors, Semiconducting wafers, Silicon, Manufacturing, Etching, Antireflective coatings

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Proceedings Article | 5 August 2004 Paper

Infrared focal plane array modeling for aerospace and automotive applications

Alain Durand, Eric de Borniol, Nicolas Guerineau, Thierry Cathala, Jean-Jacques Yon, Jean-Louis Ouvrier-Buffet, Pierre Castelein, Robert Tronel, Sylvette Bisotto, Gerard Destefanis, Jean-Paul Chamonal

Proceedings Volume 5407, (2004) https://doi.org/10.1117/12.545426

KEYWORDS: Bolometers, Electro optical modeling, Staring arrays, Sensors, Thermal modeling, Short wave infrared radiation, Cameras, Long wavelength infrared, Infrared radiation, Infrared imaging

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Proceedings Article | 19 February 2004 Paper

Low-cost amorphous silicon-based 160x120 uncooled microbolometer 2D array for high-volume applications

Cyrille Trouilleau, Arnaud Crastes, Jean-Luc Tissot, Jean-Pierre Chatard, Jean-Jacques Yon, Astrid Astier

Proceedings Volume 5251, (2004) https://doi.org/10.1117/12.515958

KEYWORDS: Amorphous silicon, Readout integrated circuits, Microbolometers, Sensors, Temperature metrology, Silicon, Manufacturing, Video, Thermography, Staring arrays

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Proceedings Article | 19 February 2004 Paper

Low cost uncooled IRFPA and molded IR lenses for enhanced driver vision

Arnaud Crastes, Jean-Luc Tissot, Yann Guimond, Pier Claudio Antonello, Joel Leleve, Hans-Joachim Lenz, Pierre Potet, Jean-Jacques Yon

Proceedings Volume 5251, (2004) https://doi.org/10.1117/12.517152

KEYWORDS: Thermography, Glasses, Infrared radiation, Infrared imaging, Infrared lenses, Enhanced vision, Lenses, Germanium, Staring arrays, Microbolometers

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Proceedings Article | 10 October 2003 Paper

Low-cost amorphous-silicon-based 160x120 uncooled microbolometer 2D array for high-volume applications

Jean-Luc Tissot, Astrid Astier, Jean-Pierre Chatard, Sebastien Tinnes, Cyrille Trouilleau, Jean-Jacques Yon

Proceedings Volume 5074, (2003) https://doi.org/10.1117/12.488383

KEYWORDS: Amorphous silicon, Microbolometers, Thermography, Sensors, Infrared imaging, Infrared radiation, Staring arrays, Electro optics, Manufacturing, Video

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Proceedings Article | 23 January 2003 Paper

Uncooled amorphous silicon technology enhancement for 25-um-pixel pitch achievement

Eric Mottin, Astrid Bain, Jean-Luc Martin, Jean-Louis Ouvrier-Buffet, Sylvette Bisotto, Jean-Jacques Yon, Jean-Luc Tissot

Proceedings Volume 4820, (2003) https://doi.org/10.1117/12.464848

KEYWORDS: Sensors, Amorphous silicon, Microbolometers, Standards development, Absorption, Electrodes, Infrared sensors, Resistance, Silicon, Etching

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Proceedings Article | 5 August 2002 Paper

Uncooled amorphous-silicon technology: high-performance achievement and future trends

Eric Mottin, Astrid Bain, Jean-Luc Martin, Jean-Louis Ouvrier-Buffet, Jean-Jacques Yon, Jean-Pierre Chatard, Jean-Luc Tissot

Proceedings Volume 4721, (2002) https://doi.org/10.1117/12.478861

KEYWORDS: Sensors, Amorphous silicon, Standards development, Electrodes, Microbolometers, Resistance, Infrared sensors, Staring arrays, Infrared imaging, Silicon

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Proceedings Article | 21 May 2002 Paper

Amorphous silicon technology improvement at CEA-LETI

Eric Mottin, Astrid Bain, Pierre Castelein, Jean-Louis Ouvrier-Buffet, Jean-Luc Tissot, Jean-Jacques Yon, Jean-Pierre Chatard

Proceedings Volume 4650, (2002) https://doi.org/10.1117/12.467656

KEYWORDS: Sensors, Amorphous silicon, Resistance, Microbolometers, Bolometers, Standards development, Infrared sensors, Infrared radiation, Silicon, Electrodes

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Proceedings Article | 10 October 2001 Paper

Enhanced amorphous silicon technology for 320 x 240 microbolometer arrays with a pitch of 35 um

Eric Mottin, Jean-Luc Martin, Jean-Louis Ouvrier-Buffet, Michel Vilain, Astrid Bain, Jean-Jacques Yon, Jean-Luc Tissot, Jean-Pierre Chatard

Proceedings Volume 4369, (2001) https://doi.org/10.1117/12.445293

KEYWORDS: Amorphous silicon, Microbolometers, Sensors, Packaging, Standards development, Silicon, Semiconducting wafers, Signal to noise ratio, Bolometers, Etching

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Proceedings Article | 15 December 2000 Paper

320 x 240 microbolometer uncooled IRFPA development

Jean-Luc Tissot, Jean-Luc Martin, Eric Mottin, Michel Vilain, Jean-Jacques Yon, Jean-Pierre Chatard

Proceedings Volume 4130, (2000) https://doi.org/10.1117/12.409888

KEYWORDS: Microbolometers, Amorphous silicon, Reliability, Sensors, Standards development, Bolometers, Silicon, Packaging, Electro optics, Staring arrays

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Proceedings Article | 17 July 2000 Paper

320x240 microblometer uncooled IRFPA

Eric Mottin, Jean-Luc Martin, Jean-Louis Ouvrier-Buffet, Michel Vilain, Jean-Jacques Yon, Jean-Pierre Chatard

Proceedings Volume 4028, (2000) https://doi.org/10.1117/12.391765

KEYWORDS: Amorphous silicon, Microbolometers, Reliability, Sensors, Bolometers, Resistance, Silicon, Electro optics, Standards development, Staring arrays

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Proceedings Article | 26 July 1999 Paper

Amorphous-silicon-based uncooled microbolometer IRFPA

Corrinne Vedel, Jean-Luc Martin, Jean-Louis Ouvrier-Buffet, Jean-Luc Tissot, Michel Vilain, Jean-Jacques Yon

Proceedings Volume 3698, (1999) https://doi.org/10.1117/12.354529

KEYWORDS: Bolometers, Sensors, Amorphous silicon, Polarization, Resistance, Microbolometers, Signal to noise ratio, Staring arrays, Reliability, Infrared sensors

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Proceedings Article | 26 October 1998 Paper

LETI/LIR's uncooled microbolometer development

Jean-Luc Tissot, Frederic Rothan, Corrinne Vedel, Michel Vilain, Jean-Jacques Yon

Proceedings Volume 3436, (1998) https://doi.org/10.1117/12.328060

KEYWORDS: Microbolometers, Bolometers, Amorphous silicon, Resistance, Detector development, Infrared detectors, Absorption, Sensors, Silicon, Readout integrated circuits

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Proceedings Article | 22 July 1998 Paper

LETI/LIR's amorphous silicon uncooled microbolometer development

Jean-Luc Tissot, Frederic Rothan, Corrinne Vedel, Michel Vilain, Jean-Jacques Yon

Proceedings Volume 3379, (1998) https://doi.org/10.1117/12.317580

KEYWORDS: Amorphous silicon, Microbolometers, Bolometers, Resistance, Infrared detectors, Detector development, Sensors, Absorption, Thermography, Silicon

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Proceedings Article | 17 October 1994 Paper

In-pixel self-calibrating IRFPA

Pierre Nicolas, Philippe Pantigny, Jacques Cluzel, Michel Vilain, Jean-Louis Ouvrier-Buffet, Jean-Jacques Yon

Proceedings Volume 2269, (1994) https://doi.org/10.1117/12.188657

KEYWORDS: Particle filters, Sensors, Readout integrated circuits, Calibration, Photovoltaics, Signal to noise ratio, Infrared technology, Multiplexers, Transistors, Capacitance

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Showing 5 of 45 publications

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