Dr. Jeong Yub Lee
at Samsung Advanced Institute of Technology
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 2 October 2024 Presentation + Paper
Proceedings Volume 13109, 131090K (2024) https://doi.org/10.1117/12.3027543
KEYWORDS: Point spread functions, Wavefront aberrations, Monochromatic aberrations, Modulation transfer functions, Metalenses, Lenses, Zernike polynomials, Wavefronts, Diffraction limit, Spherical lenses

Proceedings Article | 1 August 2021 Presentation
Joseph Smalley, Xuexin Ren, Jeong Yub Lee, Xiang Zhang, Sui Yang, Yuan Wang, Woong Ko, Won-Jae Joo, Hongkyu Park, Chang Seung Lee, Hyuck Choo
Proceedings Volume 11796, 117962C (2021) https://doi.org/10.1117/12.2595013
KEYWORDS: Sensors, CMOS sensors, Optical filters, Quantum efficiency, Optoelectronics, Visible radiation, Silicon, Polarization, Photovoltaics, Photodiodes

Proceedings Article | 21 August 2020 Presentation
Proceedings Volume 11467, 114670I (2020) https://doi.org/10.1117/12.2567387
KEYWORDS: Dielectrics, Wavefront analysis, Wavefronts, Monochromatic aberrations, Geometrical optics, Nanostructures, Lenses, Wavefront sensors, Finite-difference time-domain method, Phase shift keying

Proceedings Article | 23 May 2018 Presentation
Proceedings Volume 10671, 106710C (2018) https://doi.org/10.1117/12.2306209
KEYWORDS: Wavefronts, Dielectrics, Lenses, Geometrical optics, Nanostructures, Imaging systems, Consumer electronics, Optical storage, Digital cameras, Microscopes

Proceedings Article | 14 March 2018 Presentation
Proceedings Volume 10549, 105490V (2018) https://doi.org/10.1117/12.2288098
KEYWORDS: Waveguides, Spiral phase plates, Lithography, Control systems, Silicon photonics, Channel waveguides, Phase velocity, Integrated optics, Infrared microscopy, Spectrum analysis

Showing 5 of 9 publications
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