Jiebin Pan
at East China Institute of Photo-Electron IC
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 November 2021 Paper
Proceedings Volume 12061, 120610I (2021) https://doi.org/10.1117/12.2603293
KEYWORDS: Doping, Silicon, Electrons, Ionization, Device simulation, Tolerancing, Resistance, Diodes, Capacitance, Spectrum analysis

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