Mr. Jirí Hlubucek Profile

Jirí Hlubucek

at IPP CAS

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Author

Publications (5)

Proceedings Article | 18 June 2024 Presentation + Paper

3D speckle patterns for spectrally resolved photoluminescence tomography of optical materials

Šárka Lísková, Jiří Junek, Jiří Hlubuček, Josef Hrdlička, Karel Žídek

Proceedings Volume 12996, 129960D (2024) https://doi.org/10.1117/12.3017388

KEYWORDS: Speckle pattern, Spatial light modulators, Photoluminescence, Simulations, Optical tomography, 3D modeling, Calibration, 3D metrology

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Proceedings Article | 11 November 2016 Paper

Control of chemical composition of PZT thin films produced by ion-beam deposition from a multicomponent target

Jiri Hlubucek, David Vapenka, Petra Horodyska, Jan Vaclavik

Proceedings Volume 10151, 101510S (2016) https://doi.org/10.1117/12.2257331

KEYWORDS: Ferroelectric materials, Lead, Thin films, Ion beams, Sputter deposition, Crystals, Annealing, Perovskite, Ions, Argon

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Proceedings Article | 11 November 2016 Paper

Attempt to prepare perovskite PZT at low temperatures using IBAD

David Vapenka, Jiri Hlubucek, Petra Horodyska

Proceedings Volume 10151, 101510M (2016) https://doi.org/10.1117/12.2257328

KEYWORDS: Ferroelectric materials, Ion beams, Sputter deposition, Crystals, Thin films, Annealing, Perovskite, Titanium dioxide, Ions, Lead

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Proceedings Article | 11 November 2016 Paper

Compact and robust hyperspectral camera based on compressed sensing

K. Žídek, O. Denk, J. Hlubuček, J. Václavík

Proceedings Volume 10151, 101510N (2016) https://doi.org/10.1117/12.2250268

KEYWORDS: Cameras, Compressed sensing, Imaging spectroscopy, Hyperspectral imaging, Coded apertures, Computer programming, Objectives, Light emitting diodes, Optical components, 3D image processing

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Proceedings Article | 11 November 2016 Paper

Influence of oxygen on the quality of the PZT thin films prepared by IBS

Petra Horodyska, Jiri Hlubucek, Karel Zidek, Jan Vaclavik

Proceedings Volume 10151, 1015117 (2016) https://doi.org/10.1117/12.2257224

KEYWORDS: Perovskite, Ferroelectric materials, Thin films, Oxygen, Ion beams, Sputter deposition, Crystals, Ions, Silicon, Annealing

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