Mr. John J. Sullivan Profile

John J. Sullivan

Director, BD at Telephonics Corp

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 14 September 2007 Paper

Design of partial nulls for testing of fast aspheric surfaces

John Sullivan, John Greivenkamp

Proceedings Volume 6671, 66710W (2007) https://doi.org/10.1117/12.734874

KEYWORDS: Aspheric lenses, Wavefronts, Sensors, Interferometers, Calibration, Imaging systems, Optical spheres, Chemical elements, Spherical lenses, Optics manufacturing

Read Abstract +

Standard interferometric testing of aspheric surfaces makes use of a null optic that is matched exactly to the surface under test. This leads to part specific null lenses having to be designed, manufactured and tested for every aspheric surface to be tested. This paper discusses design issues associated with testing a range of fast aspheric optical surfaces with a single partial- or pseudo-null lens. Collecting the light that is reflected from a range of fast aspheric surfaces becomes one of the major design concerns. The partial null should also provide a reduction in the wavefront slope. The slope of the wavefront, or more specifically the fringe frequency created by the interference of the test and reference wavefronts, must not exceed the maximum measurable fringe frequency of the detector used in the system. Furthermore, since the null condition has been removed from the interferometer, light no longer travels the same path to and from the test surface. This situation leads to retrace errors introduced into the test wavefront by the interferometer. These errors must be calibrated as part of the measurement process in order to recover the aspheric test surface. The ability of the system to be calibrated must be considered in the design of the partial null.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years