Dr. Jonathan Magee
at Rofin-Baasel UK
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 15 July 2004 Paper
Proceedings Volume 5339, (2004) https://doi.org/10.1117/12.529218
KEYWORDS: Silicon, Semiconductor lasers, Laser ablation, Femtosecond phenomena, Scanning electron microscopy, Scanning transmission electron microscopy, Wavefronts, Crystals, Laser crystals, Laser damage threshold

Proceedings Article | 27 August 2003 Paper
Proceedings Volume 4876, (2003) https://doi.org/10.1117/12.463756
KEYWORDS: Laser ablation, Femtosecond phenomena, Micromachining, Pulsed laser operation, Polarization, Laser drilling, Laser applications, Electrons, Laser stabilization, Laser damage threshold

Proceedings Article | 27 August 2003 Paper
Proceedings Volume 4876, (2003) https://doi.org/10.1117/12.463752
KEYWORDS: Silicon, Pulsed laser operation, Scanning electron microscopy, Semiconductor lasers, Electron microscopes, Diffusion, Laser ablation, Femtosecond phenomena, Thermography, Plasmons

Proceedings Article | 27 August 2003 Paper
Proceedings Volume 4876, (2003) https://doi.org/10.1117/12.463744
KEYWORDS: Laser ablation, Metals, Pulsed laser operation, Laser damage threshold, Diffusion, Copper, Niobium, Titanium, Femtosecond phenomena, Laser processing

Proceedings Volume Editor (1)

SPIE Conference Volume | 8 June 2005

Conference Committee Involvement (1)
Laser-based Materials Processing
6 April 2005 | Dublin, Ireland
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