We report the spatiotemporal photoconductivity imaging on monolayer semiconductors and perovskite solar cell thin films by laser-illuminated microwave impedance microscopy (iMIM). With a spatial resolution of sub-100 nm and a temporal resolution of sub-10 ns, we are able to quantitatively measure the diffusion length and lifetime of photo-generated free carriers in these materials. The results are in good agreement with the diffusion equation and Einstein relation. Our work reveals the intrinsic time and length scales of electrical response to photo-excitation in optoelectronic van der Waals systems and photovoltaic materials.
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