Koichiro Yamauchi
at Keio Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 February 2008 Paper
Proceedings Volume 6805, 68050A (2008) https://doi.org/10.1117/12.767522
KEYWORDS: Calibration, Cameras, Imaging systems, 3D metrology, Automatic alignment, Projection systems, 3D image processing, Data acquisition, Computing systems, Distance measurement

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