Dr. Kriti K. Kohli
at GLOBALFOUNDRIES Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 March 2017 Presentation + Paper
Kriti Kohli, Mark Jobes, Ioana Graur
Proceedings Volume 10147, 101470O (2017) https://doi.org/10.1117/12.2261417
KEYWORDS: SRAF, Optical proximity correction, Machine learning, Image classification, Detection and tracking algorithms, Optical lithography, Machine vision, Computer vision technology, Principal component analysis, Image processing, Semiconducting wafers, Scanning electron microscopy, Visual process modeling, Data modeling

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