A tetragonal barium titanate (BTO) thin film of high crystal quality with a c-axis oriented out of the plane was successfully grown at 500℃ on the strontium titanate(100) substrate using the physical vapor deposition technique. It showed epitaxial growth with a dense morphology and a low full width at half maximum value (FWHM) of 0.5° in the X-ray diffraction spectroscopy rocking curve measurements of the BTO(002) reflection. Using a modified Sénarmont method, the birefringence measurement of the BTO film revealed that it predominantly exhibits a quadratic and asymmetric electrooptic (EO) behavior in response to the applied DC electric field with an effective EO coefficient value of 1.94 × 10-19 m2/V2, providing useful insights on the BTO growth and its potential optoelectronics applications.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.