The advent of nanotechnology has led to the inevitable need for miniaturization in optoelectronic devices. To achieve this goal, materials with low thickness, conductivity, and transparency, as well as a larger active area, must be developed. Experiments have proven that the opto-electrical properties of transition metal dichalcogenides (TMD)/graphene combinations are highly tunable. On the other hand, a notable feature of light when reflecting from an interface is its spatial and angular displacements. The “lateral shift” in the incident plane, referred to as the Goos–Hanchen (GH) shift, has garnered significant interest among researchers owing to its extensive range of applications. In our work, an atomically thin TMD/graphene/TMD sandwich heterostructure is proposed, and its spatial and angular GH shifts are investigated. The theoretical analysis includes various TMD materials such as MoSe2, MoS2, WSe2, and WS2. A detailed study of the effects of wavelength, polarization, incident angle, and number of TMD layers in symmetric and asymmetric structures suggests that this hybrid can serve as an ultrathin broadband tunable sensor in optical devices.
Using an oblique linearly polarized laser beam, Goos–Hänchen (GH) and Imbert–Fedorov (IF) reflection shifts of a two-dimensional array of gold nanoparticles (NPs) on water substrate are investigated within the framework of a theoretical model. The dependences of spatial ( Δ ) and angular ( Θ ) shifts on the angle of radiation, the polarity of light, the size, and concentration of particles have been studied in detail. It is shown that a grazing p-wave light yields to the highest negative amount of GH shifts, while a 45-deg polarization that radiates at 45 deg would maximize IF shifts. The deviations are sensitive to the particle size linearly and decrease using larger NPs except in the angular out-of-plane shift ΘIF, which has a critical point where its sign and trend change. The curves of ΔGH, ΘGH, and ΘIF for various lattice constant exhibit peaks for a specific arrangement that moves toward smaller values as the particle size increases. On the other hand, ΔIF always has an additive behavior. Accurate monitoring of these parameters may serve as a precise method to determine thickness and aggregation of nanostructured films.
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