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Matthew Loparco
Structures Graduate Engineer at Airbus Operations Ltd.
SPIE Involvement:
Author
Area of Expertise:
Structures , Solid Mechanics , Digital Image Correlation
Publications (1)
SPIE Journal Paper | 2 March 2017 Open Access
Traceable technique for an in situ full field in-plane measurement validation of digital image correlation
OE, Vol. 56, Issue 03, 033101, (March 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.3.033101
KEYWORDS: Digital image correlation, Calibration, Cameras, LCDs, Speckle pattern, Speckle, Error analysis, Microscopes, In situ metrology, Image processing
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