Prof. Matthias B. Hullin
Head of the Digital Material Appearance Group at Univ of Bonn
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 21 October 2016 Presentation + Paper
Proceedings Volume 9988, 998802 (2016) https://doi.org/10.1117/12.2241179
KEYWORDS: Cameras, Reflectors, Non-line-of-sight propagation, Wavefronts, Real time imaging, Computer simulations, Light sources, Sensors, Image quality, Imaging systems

Proceedings Article | 13 May 2015 Paper
Proceedings Volume 9492, 94920K (2015) https://doi.org/10.1117/12.2179559
KEYWORDS: Sensors, Photons, Single photon, Imaging systems, Electrons, Pulsed laser operation, Temporal resolution, Diodes, Cameras, Point spread functions

Proceedings Article | 13 March 2015 Paper
Dennis den Brok, Heinz Steinhausen, Matthias Hullin, Reinhard Klein
Proceedings Volume 9398, 93980F (2015) https://doi.org/10.1117/12.2078396
KEYWORDS: Cameras, Multiplexing, Light sources, Data modeling, Bidirectional reflectance transmission function, Databases, Interference (communication), Denoising, Light emitting diodes, High dynamic range imaging

Proceedings Article | 13 March 2015 Paper
Heinz Steinhausen, Rodrigo Martín, Dennis den Brok, Matthias Hullin, Reinhard Klein
Proceedings Volume 9398, 93980A (2015) https://doi.org/10.1117/12.2075717
KEYWORDS: Scanners, Cameras, Visualization, Bidirectional reflectance transmission function, Photography, Domes, Statistical modeling, Light sources and illumination, Image processing, RGB color model

Proceedings Article | 29 October 2014 Paper
Proceedings Volume 9273, 927314 (2014) https://doi.org/10.1117/12.2074695
KEYWORDS: Sensors, Cameras, Light scattering, Image acquisition, Image processing, Light, Light sources, Inverse problems, Scattering, Computational imaging

Conference Committee Involvement (5)
Optoelectronic Imaging and Multimedia Technology V
11 October 2018 | Beijing, China
Optoelectronic Imaging and Multimedia Technology IV
12 October 2016 | Beijing, China
Measuring, Modeling, and Reproducing Material Appearance 2015
9 February 2015 | San Francisco, California, United States
Optoelectronic Imaging and Multimedia Technology III
9 October 2014 | Beijing, China
Measuring, Modeling, and Reproducing Material Appearance
3 February 2014 | San Francisco, California, United States
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top