Terahertz imaging has a wide range of applications in the field of nondestructive testing. In this paper, a novel thickness-testing method based on active terahertz imaging with a non-cooled focal plane array terahertz camera is proposed, which uses the poly tetra fluoroethylene (PTFE) as the object to study. Firstly, we capture the active terahertz images of PTFE wafers of different thickness using IRXCAM-THz-384 camera. Second, by using the curve fitting method, interpolation method, grey theory model, neural network and support vector machine, the relationship between the thickness of PTFE wafers and grayscale is predicted. Then the accuracy of different methods is compared. Finally, we establish the thickness-grayscale relationship model. The experimental results show that the predicted greyscale data is close to the actual data, and the error range can be controlled within 1%, which verifies the accuracy of the model and meets practical engineering application standards.
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