Dr. Naoki Hayashi
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 February 2020 Presentation + Paper
Proceedings Volume 11245, 1124510 (2020) https://doi.org/10.1117/12.2545353
KEYWORDS: Tomography, Phase conjugation, Phase measurement, 3D image processing, Distortion, Wavefronts, Computer programming

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