Nicolas Calafat
at LYNRED
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 April 2021 Presentation + Paper
Proceedings Volume 11741, 117410M (2021) https://doi.org/10.1117/12.2587434
KEYWORDS: Visualization, Machine learning, Defect detection, Optical inspection, Sensors, Infrared radiation, Infrared imaging, Infrared detectors, Image quality, Image processing

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