The Modulation Transfer Function (MTF) is a quantitative function based on frequency resolution that characterizes
imaging system performance. In this study, a new MTF methodology is investigated for application to Radiography by
Selective Detection (RSD), an enhanced single-side x-ray Compton backscatter imaging (CBI) technique which detects
selected scatter components. The RSD imaging modality is a unique type of real-time radiography that uses a set of fin
and sleeve collimators to preferentially select different components of the x-ray backscattered field. Radiography by
selective detection has performed successfully in different non-destructive evaluation (NDE) applications. A customized
RSD imaging system was built at the University of Florida for inspection of the space shuttle external tank spray-on
foam insulation (SOFI). The x-ray backscatter RSD imaging system has been successfully used for crack and corrosion
detection in a variety of materials. The conventional transmission x-ray image quality characterization tools do not apply
for RSD because of the different physical process involved. Thus, the main objective of this project is to provide an
adapted tool for dynamic evaluation of RSD system image quality. For this purpose, an analytical model of the RSD
imaging system response is developed and supported. Two approaches are taken for the MTF calculations: one using the
Fourier Transform of a line spread function and the other one using a sine function pattern. Calibration and test targets
are then designed according to this proposed model. A customized Matlab code using image contrast and digital curve
recognition is developed to support the experimental data and provide the Modulation Transfer Functions for RSD.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.