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Olivier Arnould
at Ecole normale superieure Paris-Saclay
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Publications (1)
Proceedings Article | 28 March 2005 Paper
Thermal evaluation of the mean fatigue limit of a complex structure
Proceedings Volume 5782, (2005) https://doi.org/10.1117/12.604885
KEYWORDS: Nickel, Infrared cameras, Temperature metrology, Infrared radiation, Sensors, CCD cameras, Reliability, Electroplating, Copper, Signal processing
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