Paul Gallager
at Applied Materials, Inc.
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 13 June 2022 Presentation
Rutger M. Thijssen, Paul Gallagher, Robert Visser
Proceedings Volume PC12054, PC120540V (2022) https://doi.org/10.1117/12.2618060
KEYWORDS: Optics manufacturing, Optical components, High volume manufacturing, Wafer-level optics, Optical testing, Nanostructures, Semiconducting wafers, Photons, Optical testing equipment, Optical properties

Proceedings Article | 6 April 2021 Presentation
Proceedings Volume 11764, 117641C (2021) https://doi.org/10.1117/12.2598229

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