Dr. Pratik Chaturvedi
Engineering Group Leader at Intel
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 February 2009 Paper
Proceedings Volume 7205, 72050V (2009) https://doi.org/10.1117/12.808455
KEYWORDS: Metamaterials, Nanoimprint lithography, Amorphous silicon, Modulation, Magnetism, Ultrafast phenomena, Refractive index, Femtosecond phenomena, Silicon, Reflectivity

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