CONFERENCE PROCEEDINGS
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Ruowei Gu
at OPTON Co Ltd
SPIE Involvement:
Author
Publications (3)
Proceedings Article | 29 July 2002 Paper
Absolute 3D sensor with single fringe-pattern recording
Yoichiro Kasai, Yoko Miyamoto, Mitsuo Takeda, Hideyuki Tanaka, Ruowei Gu
Proceedings Volume 4900, (2002) https://doi.org/10.1117/12.484554
KEYWORDS: Spatial frequencies, Fringe analysis, Modulation, Fourier transforms, 3D metrology, Sensors, Imaging systems, Cameras, Multiplexing, Image sensors
SPIE Journal Paper | 1 January 2000
Absolute 3-D shape measurements using coaxial and coimage plane optical systems and Fourier fringe analysis for focus detection
Mitsuo Takeda, Takahiro Aoki, Yoko Miyamoto, Hideyuki Tanaka, Ruowei Gu, Zhibo Zhang
OE, Vol. 39, Issue 01, (January 2000) https://doi.org/10.1117/12.10.1117/1.602336
KEYWORDS: Fringe analysis, Optical transfer functions, Fourier transforms, 3D metrology, Microscopes, Confocal microscopy, Image sensors, Spatial frequencies, Projection systems, Optical engineering
Proceedings Article | 13 August 1999 Paper
3D shape measurement using a coaxial and coimage-plane fringe projection and observation system
Mitsuo Takeda, Takahiro Aoki, Yoko Miyamoto, Hideyuki Tanaka, Ruowei Gu, Zhibo Zhang
Proceedings Volume 3744, (1999) https://doi.org/10.1117/12.357703
Conference Committee Involvement (3)
Optoelectronic Imaging and Multimedia Technology II
5 November 2012 | Beijing, China
Optoelectronic Imaging and Multimedia Technology
18 October 2010 | Beijing, China
Optoelectronic Imaging and Process Technology
19 October 2009 | Shanghai, China
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