By controlling four tips independently, mechanically and electrically, in an organic manner, we can do novel measurements in nanometer scales, which are impossible by single-tip scanning tunneling microscopes (STM). The four-tip STM makes possible to measure electrical properties of nano-scale devices and materials, and also to directly image Green's function that represents propagation of electron wavefunction. We can now bring two tips as close as 20 nm to each other by using conductive carbon-nanotube tips in the four-tip STM. A new controller which drives the four tips with a single computer is another important clue for practical use of the four-tip STM.
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