Mr. Tatsuya Yamazaki Profile

Tatsuya Yamazaki

General Manager at Canon Inc

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Author

Publications (5)

Proceedings Article | 6 May 2004 Paper

A method to measure the presampling MTF using a novel edge test device and algorithm

Tatsuya Yamazaki, Makoto Nokita, Shinsuke Hayashida, Hitoshi Inoue

Proceedings Volume 5368, (2004) https://doi.org/10.1117/12.534051

KEYWORDS: Modulation transfer functions, Radiography, X-rays, Sensors, Algorithm development, Detection and tracking algorithms, Edge detection, Tungsten, Medical physics, Medical imaging

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Proceedings Article | 6 May 2004 Paper

Performance of a novel 43-cm x 43-cm flat-panel detector with CsI:Tl scintillator

Tatsuya Yamazaki, Tomoyuki Tamura, Makoto Nokita, Satoshi Okada, Shinsuke Hayashida, Yoshihiro Ogawa

Proceedings Volume 5368, (2004) https://doi.org/10.1117/12.534010

KEYWORDS: Sensors, Radiography, Scintillators, Modulation transfer functions, X-rays, Sensor technology, Amorphous silicon, X-ray detectors, Quantum efficiency, Spatial frequencies

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Proceedings Article | 28 June 2001 Paper

Sensor gain and noise requirements for fluoroscopic applications

Tatsuya Yamazaki, Laurence Court, Toshio Kameshima

Proceedings Volume 4320, (2001) https://doi.org/10.1117/12.430872

KEYWORDS: Sensors, X-rays, Gallium arsenide, Quantum efficiency, Absorption, CCD image sensors, Signal to noise ratio, Interference (communication), X-ray detectors, Spatial frequencies

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Proceedings Article | 28 June 2001 Paper

Development and evaluation of a portable amorphous silicon flat-panel x-ray detector

Minoru Watanabe, Chiori Mochizuki, Toshio Kameshima, Tatsuya Yamazaki, Laurence Court, Shinsuke Hayashida, Masakazu Morishita, Shin-ichi Ohta

Proceedings Volume 4320, (2001) https://doi.org/10.1117/12.430918

KEYWORDS: Sensors, X-ray detectors, Packaging, Contrast transfer function, Detector development, Signal detection, X-rays, Spatial frequencies, Signal processing, Amorphous silicon

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Proceedings Article | 24 July 1998 Paper

Novel large-area MIS-type x-ray image sensor for digital radiography

Toshio Kameshima, Noriyuki Kaifu, Eiichi Takami, Masakazu Morishita, Tatsuya Yamazaki

Proceedings Volume 3336, (1998) https://doi.org/10.1117/12.317045

KEYWORDS: X-rays, Sensors, Electrodes, X-ray imaging, Semiconductors, Radiography, Signal to noise ratio, Image sensors, Modulation transfer functions, Amorphous silicon

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