Thomas Kocian
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 8 June 2015 Paper
A. Kennedy, P. Masini, M. Lamb, J. Hamers, T. Kocian, E. Gordon, W. Parrish, R. Williams, T. LeBeau
Proceedings Volume 9451, 94511C (2015) https://doi.org/10.1117/12.2177462
KEYWORDS: Packaging, Microbolometers, Accelerated life testing, Semiconductors, Electronics, Cameras, Sensors, Manufacturing, Semiconducting wafers, Thermal weapon sites

Proceedings Article | 21 May 2011 Paper
S. Black, T. Sessler, E. Gordon, R. Kraft, T. Kocian, M. Lamb, R. Williams, T. Yang
Proceedings Volume 8012, 80121A (2011) https://doi.org/10.1117/12.887816
KEYWORDS: Bolometers, Readout integrated circuits, Microbolometers, Reticles, Electronics, Sensors, Silicon, Resistance, Process control, Semiconducting wafers

Proceedings Article | 4 May 2010 Paper
S. Black, R. Kraft, A. Medrano, T. Kocian, D. Bradstreet, R. Williams, T. Yang
Proceedings Volume 7660, 76600X (2010) https://doi.org/10.1117/12.853675
KEYWORDS: Bolometers, Packaging, Vanadium, Sensors, Calibration, Silicon, Manufacturing, Resistance, Process control, Semiconducting wafers

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top