Dr. Thomas Krist Profile

Dr. Thomas Krist

at NOB Nano Optics Berlin GmbH

SPIE Involvement:

Author

Publications (5)

Proceedings Article | 8 June 2023 Presentation

Soft x-ray absorption spectroscopy in the lab using laser-based sources and novel reflection zone-plate optics

Holger Stiel, Julia Braenzel, Matthias Schnuerer, Johannes Tuemmler, Themis Sidiroupolos, Richard Gnewkow, Ioanna Mantouvalou, Christian Seifert, Alexei Erko, Thomas Krist, Lutz Ehrentraut, Marc Dummin

Proceedings Volume 12582, 125820C (2023) https://doi.org/10.1117/12.2665059

KEYWORDS: X-ray optics, X-rays, Zone plates, Absorption spectroscopy, Spectroscopy, X-ray sources, Ultrafast laser spectroscopy, Transition metals, Synchrotrons, Plasmas

Read Abstract +

Proceedings Article | 7 June 2023 Presentation + Paper

Soft x-ray spectroscopy in the lab with an ellipsoidal mirror and a wavefront corrected reflection zone plate

Jürgen Probst, Heike Löchel, Thomas Krist, Christoph Braig, Christian Seifert

Proceedings Volume 12576, 125760C (2023) https://doi.org/10.1117/12.2663780

KEYWORDS: X-rays, Mirrors, Wavefronts, Spectroscopy, Zone plates, Reflection, Wavefront errors, Design and modelling, Silicon, Point spread functions

Read Abstract +

Proceedings Article | 7 June 2021 Paper

Interferometrical profilometer for high precision 3D measurements of free-form optics topography with large local slopes

M. Kühnel, E. Langlotz, I. Rahneberg, D. Dontsov, J. Probst, T. Krist, C. Braig, A. Erko

Proceedings Volume 11853, 1185309 (2021) https://doi.org/10.1117/12.2593700

Read Abstract +

Proceedings Article | 2 October 2019 Paper

Diffraction compensation of slope errors on strongly curved grating substrates

Christoph Braig, Jürgen Probst, Enrico Langlotz, Ilko Rahneberg, Michael Kühnel, Alexei Erko, Thomas Krist, Christian Seifert

Proceedings Volume 11109, 111090U (2019) https://doi.org/10.1117/12.2550336

KEYWORDS: Spherical lenses, Mirrors, Diffraction gratings, Spectrometers, Spectral resolution, Diffraction, X-rays, Diffraction, Ray tracing, X-rays, Optical design, Ray tracing, Error analysis, Optical design, Error analysis

Read Abstract +

Proceedings Article | 8 November 2001 Paper

Solid state neutron polarizers and collimators

Thomas Krist, Ferenc Mezei

Proceedings Volume 4509, (2001) https://doi.org/10.1117/12.448063

KEYWORDS: Collimators, Semiconducting wafers, Silicon, Solid state physics, Gadolinium, Polarizers, Optical components, Polarization, Sensors, Magnetism

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years