Dr. Valerio Laino
Project Manager at Exalos AG
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 20 February 2009 Paper
M. Duelk, V. Laino, P. Navaretti, R. Rezzonico, C. Armistead, C. Vélez
Proceedings Volume 7168, 716821 (2009) https://doi.org/10.1117/12.809078
KEYWORDS: Polarization, Optical coherence tomography, Optical isolators, Coherence (optics), Diodes, Interferometers, Tolerancing, Imaging systems, Silver, Ophthalmology

Proceedings Article | 5 March 2008 Paper
Proceedings Volume 6847, 68472N (2008) https://doi.org/10.1117/12.763480
KEYWORDS: Optical coherence tomography, Light emitting diodes, Light sources, Quantum wells, Fiber optic gyroscopes, Fiber optics sensors, Coherence (optics), Optical components, Fiber optics, Sensors

Proceedings Article | 23 March 2007 Paper
Bernd Witzigmann, Valerio Laino, Friedhard Roemer, Christoph Lauterbach, Ulrich Schwarz, Christian Rumbolz, Martin Schillgalies, Alfred Lell, Uwe Strauss, Volker Härle
Proceedings Volume 6468, 64680Q (2007) https://doi.org/10.1117/12.700920
KEYWORDS: Waveguides, Near field optics, Optical simulations, Dispersion, Refractive index, Semiconductor lasers, Gallium nitride, Waveguide modes, Metals, Semiconductors

Proceedings Article | 14 April 2006 Paper
Bernd Witzigmann, Valerio Laino, Mathieu Luisier, Friedhard Roemer, Georg Feicht, Ulrich Schwarz
Proceedings Volume 6184, 61840E (2006) https://doi.org/10.1117/12.662048
KEYWORDS: Quantum wells, Semiconductor lasers, Optical simulations, Temperature metrology, Gallium nitride, Optical design, Laser damage threshold, Indium gallium nitride, Luminescence, Crystals

Proceedings Article | 28 February 2006 Paper
Proceedings Volume 6115, 61151Z (2006) https://doi.org/10.1117/12.645039
KEYWORDS: Hole burning spectroscopy, Light emitting diodes, Quantum wells, Reflectivity, 3D modeling, Optical simulations, Laser damage threshold, Solids, 3D metrology, Optics manufacturing

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