Dr. Wen Feng
Research Associate at Texas Tech Univ
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 19 February 2009 Paper
W. Feng, V. Kuryatkov, M. Pandikunta, S. Nikishin, M. Holtz
Proceedings Volume 7216, 721622 (2009) https://doi.org/10.1117/12.809179
KEYWORDS: Indium gallium nitride, Gallium nitride, Indium, Photomasks, Quantum wells, Scanning electron microscopy, Diffusion, Silica, Crystals, Gallium

Proceedings Article | 11 September 2006 Paper
W. Feng, J. Pan, F. Zhou, L. Wang, J. Bian, B. Wang, X. An, L. Zhao, H. Zhu, W. Wang
Proceedings Volume 6321, 63210I (2006) https://doi.org/10.1117/12.677615
KEYWORDS: Waveguides, Heterojunctions, Photomasks, Scanning electron microscopy, Diffusion, Indium, Internal quantum efficiency, Quantum efficiency, Optical components, Laser development

SPIE Journal Paper | 1 September 2006 Open Access
Wen Feng, Y. Ding, Jiaoqing Pan, Lingjuan Zhao, Hongliang Zhu, Wei Wang
OE, Vol. 45, Issue 09, 090501, (September 2006) https://doi.org/10.1117/12.10.1117/1.2355658
KEYWORDS: Heterojunctions, Laser development, Quantum efficiency, Etching, Dielectrics, Photomasks, Semiconducting wafers, Laser damage threshold, Fiber lasers, Bohrium

SPIE Journal Paper | 1 June 2005 Open Access
Lianping Hou, Wei Wang, Wen Feng, Song Liang, Hongliang Zhu, Fan Zhou, Lufeng Wang, Jing Bian
OE, Vol. 44, Issue 06, 060508, (June 2005) https://doi.org/10.1117/12.10.1117/1.1920528
KEYWORDS: Modulators, Semiconductor lasers, Single mode fibers, Waveguides, Modulation, Optical testing, Mineralogy, Photonic integrated circuits, Tolerancing, Semiconducting wafers

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