Dr. Young-Han Shin Profile

Dr. Young-Han Shin

at Univ of Ulsan

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Publications (1)

Proceedings Article | 27 April 2023 Presentation + Paper

SEMI-PointRend: improved semiconductor wafer defect classification and segmentation as rendering

MinJin Hwang, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Young-han Shin

Proceedings Volume 12496, 1249608 (2023) https://doi.org/10.1117/12.2657555

KEYWORDS: Image segmentation, Bridges, Scanning electron microscopy, Semiconductors, Data modeling, Semiconducting wafers, Defect detection, Statistical analysis, Defect inspection

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