Prof. Andrés G. Marrugo
Professor at Univ Tecnológica de Bolívar
SPIE Involvement:
Conference Co-Chair | Author
Area of Expertise:
Optical metrology , Medical imaging , Computer vision , Image processing
Profile Summary

Dr. Marrugo is an Associate Professor in the Department of Mechanical and Mechatronics Engineering at the Universidad Tecnológica de Bolívar (UTB), Colombia, where he did his B.Eng. in Mechatronics Engineering (Summa Cum Laude). He received his Ph.D. in Optical Engineering (Cum Laude) and his M.Sc. in Photonics from the Universitat Politècnica de Catalunya, Spain. He was the recipient of the Honours Diploma for Young Researchers from the Spanish Optical Society (SEDOPTICA) and the DCS Rising Researchers recognition from SPIE. At UTB, Professor Marrugo's lab is called Laboratorio de Óptica y Procesamiento de Imágenes (OPI-Lab), and together with his team they innovate in optical technologies and develop methods for 2D and 3D image acquisition/analysis for biomedical and industrial applications. He has co-authored over 50 conference and journal papers, co-edited one book, two book chapters, and one patent (pending). He has been an SPIE member since 2012.
Publications (25)

Proceedings Article | 4 October 2023 Presentation + Paper
Proceedings Volume 12673, 1267309 (2023) https://doi.org/10.1117/12.2677133
KEYWORDS: Projection systems, Cameras, Calibration, Fringe analysis, Image processing, Camera calibration, 3D projection, 3D modeling, 3D image processing

Proceedings Article | 16 June 2023 Presentation + Paper
Proceedings Volume 12524, 125240G (2023) https://doi.org/10.1117/12.2664197
KEYWORDS: Calibration, Cameras, 3D modeling, Systems modeling, Imaging systems, Structured light, Projection systems, Visual process modeling, Performance modeling, Matrices

Proceedings Article | 16 June 2023 Presentation + Paper
Proceedings Volume 12524, 1252404 (2023) https://doi.org/10.1117/12.2663955
KEYWORDS: Object detection, 3D image processing, Imaging systems, Cameras, 3D projection, Projection systems, Deep learning, Systems modeling

Proceedings Article | 13 June 2023 Presentation + Paper
Proceedings Volume 12527, 125270P (2023) https://doi.org/10.1117/12.2663895
KEYWORDS: Data modeling, Machine learning, Image quality, Microscopy, Image classification, Deep learning, Image segmentation

Proceedings Article | 31 May 2022 Presentation + Paper
Proceedings Volume 12098, 1209809 (2022) https://doi.org/10.1117/12.2618958
KEYWORDS: Image quality, Signal to noise ratio, Electronic filtering, Optical filters, 3D image processing, Microscopes, Image resolution, Digital holography, Microscopy, Reflectivity

Showing 5 of 25 publications
Conference Committee Involvement (5)
Dimensional Optical Metrology and Inspection for Practical Applications XIII
24 April 2024 | National Harbor, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications XII
2 May 2023 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications XI
5 April 2022 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications X
12 April 2021 | Online Only, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications IX
27 April 2020 | Online Only, California, United States
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