This paper establishes a theoretical model of silicon substrate irradiated by the combined laser which is composed of a high-peak-power laser and a continuous laser. We use the finite element method to analyse the temperature of the silicon substrate irradiated by the combined laser. Then we compare the damage effect of the silicon substrate which is respectively irradiated by the combined laser and continuous laser, which is under the condition that the average power density of combined laser is equal to the continuous laser. The results show that the laser can melt the surface of silicon substrate in a short time, while the continuous laser can not achieve this effect. The combined laser damage in silicon substrate is stronger than continuous laser.
In this paper, an experimental system for detecting the damage degree of the imaging optical system by using the cat's eye echo is established. The change mechanism of peak power of cat's eye echo is analyzed under different irradiation time. The relationship between the peak power of the echo and the damage degree of the CCD are established accordingly. The study found that the peak power of the cat's eyes echoes decrease dramatically, then increase significantly, then drop again, then increase again and decrease finally with the increase of the degree of damage of the CCD according to the damage order. In practical application, it is possible to judge the damage state of the enemies optoelectronic imaging equipment according to this rule.
In this paper, we establish the cat's eye echoes model of the optical imaging system under different damage conditions and analyze the influence of the damage to CCD layers on the cat's eye echo power. Based on this, the corresponding relationship between the echo power of the cat's eye and the damage degree of the CCD was established and verified by experiments. The results show that the field intensity is the strongest in the center of cat's eye echo in the imaging optics system, and the power of the echo increases dramatically and then decrease steeply and decrease slowly. The damaged status of CCD can be judged according to this rule. This study has certain reference value for the actual situation that the degree of the damage to CCD is required to be monitored in real time in the far field.
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