Paper
4 December 2024 Research on measuring method of key parameters of multi-pixel photon counter
Author Affiliations +
Proceedings Volume 13283, Conference on Spectral Technology and Applications (CSTA 2024); 132835I (2024) https://doi.org/10.1117/12.3038115
Event: Conference on Spectral Technology and Applications (CSTA 2024), 2024, Dalian, China
Abstract
Multi-pixel photon counters (MPPCs) have attracted much attention in low-light detection, andhave been widely used in lidar, high-energy particle physics, nuclear physics, astrophysics, nuclear medicine imaging and spectroscopy. Accurate measuring of MPPC key parameters is the prerequisite for judging its performance level. In this paper, the measuring methods of key parameters of MPPCare studied comprehensively, and relatively simple measuring methods are proposed, mainly including the measuring methods of pulse waveform characteristics, Dark Counting Rate (DCR), Photon DetectionEfficiency (PDE), photon number-resolved spectrum, optical crosstalk probability, gain and reverse volt-ampere characteristics of MPPC. A test measuring system is built. The parameters of typical MPPC devices are measured experimentally. The test results are reasonable, and the measured values of various parameters are basically consistent with the nominal values in the MPPCdevice specification.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Yue Wang, Yanfei Yang, Yun Wu, Lei Wang, Lu Liu, Lina Liu, Lianbi Li, Xiaoxiang Han, Zebin Li, and Guoqing Zhang "Research on measuring method of key parameters of multi-pixel photon counter", Proc. SPIE 13283, Conference on Spectral Technology and Applications (CSTA 2024), 132835I (4 December 2024); https://doi.org/10.1117/12.3038115
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KEYWORDS
Crosstalk

Oscilloscopes

Photon counting

Pulse signals

Light sources

Integrating spheres

Histograms

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