Active machine vision system for surface quality inspection

Cor L. Claeys; Ingrid Debusschere; Nico Ricquier; Peter Seitz; Martin Stalder; Jeffrey M. Raynor; Graham K. Lang; Giuseppe Cilia; C. Cavanna; U. Muessigmann; A. Abele

doi:10.1117/12.171209

11 March 1994 Active machine vision system for surface quality inspection

Cor L. Claeys, Ingrid Debusschere, Nico Ricquier, Peter Seitz, Martin Stalder, Jeffrey M. Raynor, Graham K. Lang, Giuseppe Cilia, C. Cavanna, U. Muessigmann, A. Abele

Author Affiliations +

Proceedings Volume 2183, Machine Vision Applications in Industrial Inspection II; (1994) https://doi.org/10.1117/12.171209
Event: IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology, 1994, San Jose, CA, United States

Abstract

The realization of an integrated, flexible, and robust CIM vision system, suitable for performing quality-assurance surface inspections is discussed. The optimized combination of advanced optics, optomechanics, and flexible image sensor realizes a high 'virtual resolution' without penalizing the pixel transfer rate. High computation rates are obtained by complementing the fractal inspection algorithm with a dynamic hologram, a modular data flow processor, and the system computer. The integrated vision system is validated for the surface quality inspection of concrete tiles in an industrial environment. The overall system performance is discussed in detail and the potential of the system for other application fields will be addressed.

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Cor L. Claeys, Ingrid Debusschere, Nico Ricquier, Peter Seitz, Martin Stalder, Jeffrey M. Raynor, Graham K. Lang, Giuseppe Cilia, C. Cavanna, U. Muessigmann, and A. Abele "Active machine vision system for surface quality inspection", Proc. SPIE 2183, Machine Vision Applications in Industrial Inspection II, (11 March 1994); https://doi.org/10.1117/12.171209

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