PROCEEDINGS VOLUME 4608
WORKSHOP ON NANOSTRUCTURE SCIENCE, METROLOGY, AND TECHNOLOGY | 5-7 SEPTEMBER 2001
Nanostructure Science, Metrology, and Technology
Editor(s): Martin C. Peckerar, Michael T. Postek Jr.
Editor Affiliations +
IN THIS VOLUME

5 Sessions, 34 Papers, 0 Presentations, 0 Posters
WORKSHOP ON NANOSTRUCTURE SCIENCE, METROLOGY, AND TECHNOLOGY
5-7 September 2001
Gaithersburg, MD, United States
General Session
Kathleen Kingscott
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.427103
Biological Sciences
Michael T. Postek Jr., Martin C. Peckerar
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.427104
Military Sciences
Gerald M. Borsuk
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.427105
Metrological Sciences
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.427107
Military Sciences
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.427109
Electronics Sciences
Douglas J. Resnick, Todd C. Bailey, David P. Mancini, Kevin J. Nordquist, William J. Dauksher, Eric S. Ainley, A. Talin, Kathleen A. Gehoski, Jeff H. Baker, et al.
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.437269
Philip E. Thompson, Joe Bennett
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.437270
Biological Sciences
Dean A. Scribner, Mark S. Humayun, Brian L. Justus, Charles D. Merritt, Richard B. Klein, J. Grant Howard, Martin C. Peckerar, F. Keith Perkins, Lee J. Johnson, et al.
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.437271
Electronics Sciences
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.437272
Metrological Sciences
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.437273
Electronics Sciences
Orest J. Glembocki, Sharka M. Prokes, Thomas A. Kennedy, A. K. Rajagopal
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.437690
Mu-San Chen, Walter J. Dressick, Terence L. Schull, Susan L. Brandow
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.437739
Metrological Sciences
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.437740
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.437742
Electronics Sciences
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.437804
Biological Sciences
Ilko K. Ilev, Ronald W. Waynant
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.437971
Metrological Sciences
Albert Sicignano, Arkady V. Nikitin, Dmitriy Y. Yeremin, Matthew Sandy, E. Tim Goldburt
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.437972
Biological Sciences
Bruce Zhi Gao, Joseph N. Fass, Michael J. Renn, David J. Odde
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.438454
Electronics Sciences
Samuel S. Mao, Richard E. Russo, Peidong Yang
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.438455
Siva Manickavasagam, Craig Saltiel, M. Pinar Menguec, Martin L. Sadowski, Zbigniew M. Drozdowicz
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.438491
Metrological Sciences
J. A. Stroscio, E. W. Hudson, S. R. Blankenship, Robert J. Celotta, A. P. Fein
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.438493
Electronics Sciences
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.465124
Metrological Sciences
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.465125
Electronics Sciences
Vadim I. Rakhovsky
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.465224
Lee S. Magness, L Kecskes, Francis S. Biancaniello, Stephen D. Ridder, M Chung, D Kapoor
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.465225
General Session
Martin C. Peckerar
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.465226
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.465456
Military Sciences
- -
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.465462
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.465464
Metrological Sciences
- -
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.465472
Electronics Sciences
- -
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.465494
Biological Sciences
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.465476
F. Keith Perkins, L M Tender, S J Fertig, Martin C. Peckerar
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.465477
Kaveh Zamani
Proceedings Volume Nanostructure Science, Metrology, and Technology, (2002) https://doi.org/10.1117/12.465484
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