A comprehensive model of catastrophic optical-damage in broad-area laser diodes

A. K. Chin; R. K. Bertaska; M. A. Jaspan; A. M. Flusberg; S. D. Swartz; M. T. Knapczyk; R. Petr; I. Smilanski; J. H. Jacob

doi:10.1117/12.804834

23 February 2009 A comprehensive model of catastrophic optical-damage in broad-area laser diodes

A. K. Chin, R. K. Bertaska, M. A. Jaspan, A. M. Flusberg, S. D. Swartz, M. T. Knapczyk, R. Petr, I. Smilanski, J. H. Jacob

Author Affiliations +

Proceedings Volume 7198, High-Power Diode Laser Technology and Applications VII; 71981A (2009) https://doi.org/10.1117/12.804834
Event: SPIE LASE: Lasers and Applications in Science and Engineering, 2009, San Jose, California, United States

Abstract

The present model of formation and propagation of catastrophic optical-damage (COD), a random failure-mode in laser diodes, was formulated in 1974 and has remained substantially unchanged. We extend the model of COD phenomena, based on analytical studies involving EBIC (electron-beam induced current), STEM (scanning transmission-electron microscopy) and sophisticated optical-measurements. We have determined that a ring-cavity mode, whose presence has not been previously reported, significantly contributes to COD initiation and propagation in broad-area laser-diodes.

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A. K. Chin, R. K. Bertaska, M. A. Jaspan, A. M. Flusberg, S. D. Swartz, M. T. Knapczyk, R. Petr, I. Smilanski, and J. H. Jacob "A comprehensive model of catastrophic optical-damage in broad-area laser diodes", Proc. SPIE 7198, High-Power Diode Laser Technology and Applications VII, 71981A (23 February 2009); https://doi.org/10.1117/12.804834

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